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Electric field compensation and sensing with a single ion in a planar\n trap

2011/06/10 by S Selvarajan, Nikos Daniilidis, Selvarajan, Sankaranarayanan +13 · 1 citation
Chemical Engineering · Physics and Astronomy · #Advanced Frequency and Time Standards #Analytical Chemistry and Sensors #Atomic Physics (physics.atom-ph) #Atomic and Subatomic Physics Research #Cold Atom Physics and Bose-Einstein Condensates #FOS: Physical sciences #Instrumentation and Detectors (physics.ins-det) #Quantum Physics (quant-ph)

paper · pdf · doi:10.48550/arxiv.1106.2730

openalex publication_date 2011/06/10 · openalex created_date 2022/10/03 · openalex updated_date 2026/07/28

Abstract

We use a single ion as an movable electric field sensor with accuracies on\nthe order of a few V/m. For this, we compensate undesired static electric\nfields in a planar RF trap and characterize the static fields over an extended\nregion along the trap axis. We observe a strong buildup of stray charges around\nthe loading region on the trap resulting in an electric field of up to 1.3 kV/m\nat the ion position. We also find that the profile of the stray field remains\nconstant over a time span of a few months.\n

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