2014/05/20 by Gangadhar Das, Mahesh Tiwari, Das, Gangadhar +7
Physics and Astronomy · Medicine · #X-ray Spectroscopy and Fluorescence Analysis #Advanced X-ray Imaging Techniques #Advanced MRI Techniques and Applications
paper · pdf · doi:10.48550/arxiv.1405.5043
Total reflection x-ray fluorescence (TXRF) spectroscopy has seen a remarkable\nprogress over the past years. Numerous applications in basic and applied\nsciences prove its importance. The large spectral background which is a major\ndetrimental factor in the conventional x-ray fluorescence technique, limits the\nelement detection sensitivities of the technique to ppm range. This spectral\nbackground reduces to a great extent in the TXRF technique due to the low\nextinction depth of the primary incident x-ray beam. In synchrotron radiation\n(SR) based TXRF measurements the spectral background reduces further because of\nthe polarization of the synchrotron x-ray beam. Here, we discuss in detail the\ninfluence of synchrotron polarization on the spectral background in a\nfluorescence spectrum and its significance towards TXRF detection\nsensitivities. We provide a detailed theoretical description and show that how\nanisotropic scattering probability densities of the Compton and Elastic\nscattered x-rays depend on the scattering angle (\θ) and azimuthal angle\n(\φ) in the polarization plane of the SR beam.\n