2022/05/12 by Nadine Wetta, Wetta, Nadine, Jean‐Christophe Pain +1
Engineering · Materials Science · Physics and Astronomy · #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Plasma Physics (physics.plasm-ph) #Semiconductor materials and devices #Surface and Thin Film Phenomena
paper · pdf · doi:10.48550/arxiv.2205.06145
openalex publication_date 2022/05/12 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
In the Ziman-Evans formulation, the electrical resistivity involves several quantities like the plasma mean ionization and chemical potential, the electron-ion scattering cross-section, the ion-ion structure factor, and the derivative of the Fermi distribution with respect to electron energy. Therefore, in order to make significant progress while comparing different models or analyzing experimental measurements, it is important to try to get insight into such partial physical quantities. In the present work, we propose to investigate the sensitivity of the resistivity to the different physical quantities required for its computation.