Robust estimation based on one-shot device test data under log-normal lifetimes

2022/11/03 by Balakrishnan, N., Castilla, E. · 1 citation
#Applications (stat.AP) #FOS: Computer and information sciences

paper · doi:10.48550/arxiv.2211.02118

Abstract

In this paper we present robust estimators for one-shot device test data under lognormal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also developed. Their robustness feature is illustrated through a simulation study and two numerical examples.

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