2024/03/27 by V. Goumarre, Yasith Amarasinghe, Goumarre, Vincent +7
Chemistry · Engineering · #Acoustic Wave Resonator Technologies #FOS: Physical sciences #Optics (physics.optics) #Spectroscopy and Laser Applications #Terahertz technology and applications
paper · pdf · doi:10.48550/arxiv.2403.18531
openalex publication_date 2024/03/27 · openalex created_date 2024/03/29 · openalex updated_date 2026/07/28
With the development of terahertz time-domain spectroscopy, methods have been proposed to precisely estimate the thickness, refractive index, and attenuation coefficient of a sample. In this article, we propose a new method to compute these parameters. In this method, the attenuation is expressed in function of the refractive index. The theoretical unwrapped angle, which therefore only depends on the refractive index, is then matched to the experimental value. By applying already existing methods for estimating the thickness of an optically thick sample, the dielectric properties of the sample can be deduced. The method is applied both to the transmission and reflection spectroscopy. A demonstration of the method and a comparison with the previous methods are finally shown.