Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors

2025/10/21 by Yi-Te Lee, Yu-Ting Huang, Shao-Pin Chiu +8
#2D materials #2D transist #Coulomb scattering strength #electron scattering #indium selenide #interfacial Coulomb scatterers #low-frequency noise

paper · doi:10.48505/nims.5809

Abstract

ACS Applied Materials & Interfaces. 16 [1] (2024)1066-1073

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