2011/10/24 by Gennady I. Zebrev, Zebrev, Gennady I., Evgeny V. Melnik +3
Materials Science · Physics and Astronomy · #Carbon Nanotubes in Composites #FOS: Physical sciences #Graphene research and applications #Mesoscale and Nanoscale Physics (cond-mat.mes-hall) #Quantum and electron transport phenomena #cond-mat.mes-hall
paper · pdf · doi:10.48550/arxiv.1110.5205
4 pages, 7 figures, a report to MIEL 2012
openalex publication_date 2011/10/24 · arxiv created 2012/02/02 · arxiv updated 2012/02/03 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
Methods of extraction of interface trap level density in graphene field-effect devices from the capacitance-voltage measurements are described and discussed. Interrelation with the graphene Fermi velocity extraction is shown. Similarities and differences in interface trap extraction procedure in graphene and silicon field-effect structures are briefly discussed.