2014/10/04 by J. Los, Silvia Gabardi, Los, Jan H. +5 · 1 citation
Engineering · Materials Science · Physics and Astronomy · #Advanced Semiconductor Detectors and Materials #Computational Physics (physics.comp-ph) #Disordered Systems and Neural Networks (cond-mat.dis-nn) #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #Phase-change materials and chalcogenides #Semiconductor Quantum Structures and Devices
paper · pdf · doi:10.48550/arxiv.1410.1071
openalex publication_date 2014/10/04 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
An improved inverse simulated annealing method is presented to determine the\nstructure of complex disordered systems from first principles in agreement with\navailable experimental data or desired predetermined target properties. The\neffectiveness of this method is demonstrated by revisiting the structure of\namorphous InSb. The resulting network is mostly tetrahedral and in excellent\nagreement with available experimental data.\n