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Size and Defect related Broadening of Photoluminescence Spectra in ZnO:Si Nanocomposite Films

2010/07/13 by Shabnam Shabnam, Shabnam, Chhaya Ravi Kant +3
Materials Science · Physics and Astronomy · #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #ZnO doping and properties #cond-mat.mtrl-sci

paper · pdf · doi:10.48550/arxiv.1007.2142

10 pages and 10 figures

arxiv created 2010/07/13 · openalex publication_date 2010/07/13 · arxiv updated 2010/07/14 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

Nanocomposite films of Zinc Oxide and Silicon were grown by thermal evaporation technique using varying ratios of ZnO:Si in the starting material. Analysis reveal the role of ZnO and amorphous silicon interface in contributing to relatively less common blue photoluminescence emissions (at ∼ 400 and 470nm). These blue peaks are observed along with the emissions resulting from band edge transition (370nm) and those related to defects (522nm) of ZnO. Careful analysis shows that along with the grain size of ZnO, a suitable compositional ratio (of ZnO to silicon) is critical for the coexistence of all the four peaks. Proper selection of conditions can give comparable photoluminescence peak intensities leading to broad-band emission.

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