Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa₂Cu₃O_7-δ thin films

2017/10/29 by Gauquelin, Nicolas, Zhang, Hao, Zhu, Guozhen +2 · 1 citation
#FOS: Physical sciences #Superconductivity (cond-mat.supr-con)

paper · doi:10.48550/arxiv.1710.10667

Abstract

We have discovered two novel types of planar defects that appear in heteroepitaxial YBa₂Cu₃O_7-δ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La_2/3Ca_1/3MnO₃ (LCMO) overlayer, using the combination of high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging and electron energy loss spectroscopy (EELS) mapping for unambiguous identification. These planar lattice defects are based on the intergrowth of either a BaO plane between two CuO chains or multiple Y-O layers between two CuO₂ planes, resulting in non-stoichiometric layer sequences that could directly impact the high-T_c superconductivity.

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