2004/10/27 by U. Titt, U Titt, V. Dangendorf +7
Engineering · Materials Science · Physics and Astronomy · #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Instrumentation and Detectors (physics.ins-det) #Integrated Circuits and Semiconductor Failure Analysis #X-ray Spectroscopy and Fluorescence Analysis #physics.ins-det
paper · pdf · doi:10.48550/arxiv.physics/0410261
arxiv created 2004/10/27 · openalex publication_date 2004/10/27 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
An imaging system for measuring the track structure of charged particles in a low-pressure gas is presented. We describe the experimental method and compare experimental results with first results of a simulation of the chamber response.