2024/09/05 by Sheila E. Whitman, Whitman, Sheila E., Marat I. Latypov +1
Computer Science · Materials Science · #FOS: Physical sciences #Image Processing and 3D Reconstruction #Machine Learning in Materials Science #Materials Science (cond-mat.mtrl-sci) #X-ray Diffraction in Crystallography
paper · pdf · doi:10.48550/arxiv.2409.03729
openalex publication_date 2024/09/05 · openalex created_date 2024/10/18 · openalex updated_date 2026/07/28
This study introduces the calculation of spatially-resolved chord length distribution (SR-CLD) as an efficient approach for quantifying and visualizing non-uniform microstructures in heterogeneous materials. SR-CLD enables detailed analysis of spatial variation of microstructures in different directions that can be overlooked with traditional descriptions. We present the calculation of SR-CLD using efficient scan-line algorithm that counts pixels in constituents along pixel rows or columns of microstructure images for detailed, high-resolution SR-CLD maps. We demonstrate the application of SR-CLD in three case studies: on synthetic polycrystalline microstructures with known and intentionally created uniform and gradient spatial distributions of grain size; on non-uniform microstructures from welding simulations; and on experimental images of two-phase microstructures of additively manufactured Ti alloys with significant spatially non-uniform distributions of laths of one of the phases.