2006/01/24 by F. Pérez‐Willard, F. Pérez-Willard, Daniel Wolde‐Giorgis +16
Engineering · Materials Science · Physics and Astronomy · #Advanced Materials Characterization Techniques #FOS: Physical sciences #Ion-surface interactions and analysis #Materials Science (cond-mat.mtrl-sci) #Microstructure and mechanical properties #cond-mat.mtrl-sci
paper · pdf · doi:10.48550/arxiv.cond-mat/0601543
21 pages, 6 figures
arxiv created 2006/01/24 · openalex publication_date 2006/01/24 · arxiv updated 2009/12/01 · openalex created_date 2019/06/27 · openalex updated_date 2026/07/28
Needle-shaped atom probe specimens containing a single grain boundary were produced using the focused ion beam (FIB) of a dual-beam FIB/SEM (scanning electron microscope) system. The presented specimen preparation approach allows the unprecedented study of a grain boundary which is well characterised in its crystallographic orientation by means of the field ion microscope (FIM) and the tomographic atom probe (TAP). The analysis of such specimens allows in particular the determination of solute excess atoms at this specific grain boundary and hence the investigation of the segregation behaviour. The crucial preparation steps are discussed in detail in the present study for the S 19a 331 <110> grain boundary of a 40 at.ppm-Bi doped Cu bi-crystal. Transmission electron microscope (TEM) images and TAP analyses of the atom probe tips demonstrate unambiguously the presence of the selectively prepared grain boundary in the apex region of some of the specimens.