2020/03/25 by M. Biassoni, Matteo Gugiatti, Biassoni, Matteo +19
Biochemistry, Genetics and Molecular Biology · Materials Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Instrumentation and Detectors (physics.ins-det) #X-ray Spectroscopy and Fluorescence Analysis
paper · pdf · doi:10.48550/arxiv.2003.11026
openalex publication_date 2020/03/25 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
Electron spectrometry is traditionally challenging due to the difficulty of correctly reconstructing the original energy of the detected electrons. Silicon Drift Detectors, extensively used for X-ray spectrometry, are a promising technology for the precise measurement of electrons energy. The ability to correctly model the detector entrance window response to the energy deposited by electrons is a critical aspect of this application. We hereby describe a MonteCarlo-based approach to this problem, together with characterization and validation measurements performed with electron beams from a Scanning Electron Microscope.