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The peculiarities of phase transitions in layered ferroelectrics-semiconductors TlIn1-xFexS2

1998/12/15 by R. M. Sardarli, Sardarli, R. M., A. P. Abdullayev +8
Engineering · Materials Science · Physics and Astronomy · #Condensed Matter (cond-mat) #Crystal Structures and Properties #FOS: Physical sciences #Magneto-Optical Properties and Applications #Solid-state spectroscopy and crystallography #cond-mat

paper · pdf · doi:10.48550/arxiv.cond-mat/9812244

7 pages, 3 figures in gif format, submitted to "Physica Status Solidi"

arxiv created 1998/12/15 · openalex publication_date 1998/12/15 · arxiv updated 2009/11/30 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

The results of differential-thermal analysis of various samples as well as dielectric measurements of solid solutions TlIn1-xFex56,57S2 are presented. It has been established that phase transitions become blurred and shift to low temperatures with increasing the concentration of defects in the layered structure. at some threshold value the structure loses layerity, the crystal becomes isotropig and the distribution of defects does homogeneous.

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