2013/11/23 by Bichitra Nandi Ganguly, Ganguly, Bichitra Nandi, Sreetama Dutta +10
Materials Science · Physics and Astronomy · #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #X-ray Diffraction in Crystallography #cond-mat.mtrl-sci
paper · pdf · doi:10.48550/arxiv.1311.5973
arxiv created 2013/11/23 · openalex publication_date 2013/11/23 · arxiv updated 2013/11/26 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
The structural characterization of sol-gel based nano crystalline ZnO material is being reported as we observe several previously unreported structural aspects following a sequence of annealing stages. As-grown samples were characterised by Fourier Transform Infrared Spectroscopy (FTIR). Chemical purity of the nano-grains and their crystallinity has been monitored by energy dispersive X-ray (EDAX) analysis and transmission electron microscopy (TEM), while the unusual changes in nano-crystal growth structure have been studied by X-ray diffraction method. In addition, such samples have been studied by using perturbed angular correlation (PAC) technique with the short-lived radioactive probe 111mCd. Changes in the local electronic environment following sintering of the nano-crystalline grains have been observed by this method.