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Current Noise Investigation in Josephson Devices by Switching Current Measurements

2010/07/09 by C. Granata, A. Vettoliere, Granata, C. +8
Computer Science · Engineering · Physics and Astronomy · #Advanced Electrical Measurement Techniques #FOS: Physical sciences #Quantum Information and Cryptography #Quantum and electron transport phenomena #Superconductivity (cond-mat.supr-con) #cond-mat.supr-con

paper · pdf · doi:10.48550/arxiv.1007.1540

6 pages, 5 figures

arxiv created 2010/07/09 · openalex publication_date 2010/07/09 · arxiv updated 2010/07/12 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

An experimental investigation of the critical current noise in underdamped niobium based Josephson junctions by a technique based on the switching current measurements is reported. By sweeping the junction with a current ramp we measure the critical current switching using the standard time of flight technique and analyze the data to extract the current noise. The experimental results show a linear behavior of the current white noise from both the junction area and the temperature. These measurement provide very useful information about the intrinsic noise of Josephson devices involving SQUIDs and qubits.

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