2020/01/04 by Pu, Tanchao, Ou, Jun-Yu, Papasimakis, Nikitas +1
#FOS: Physical sciences #Optics (physics.optics)
paper · doi:10.48550/arxiv.2001.01068
We report the experimental demonstration of deeply subwavelength far-field optical imaging of unlabelled samples with resolution better than λ/20. We beat the ~λ/2 diffraction limit of conventional optical microscopy several times over by recording the intensity pattern of coherent light scattered from the object into the far-field. We retrieve information about the object with a deep learning neural network trained on scattering events from a large set of known objects.