Ultrathin specimen preparation by a low energy Ar ion milling method

2024/03/05 by Masanori Mitome
#(Zn #Ar-ion milling #Cr) Te #gamma-Ga2O3 #low-energy ion beam #sample preparation #ultrathin specimen

paper · doi:10.48505/nims.4420

Abstract

MICROSCOPY (JOURNAL OF ELECTRON MICROSCOPY). 62 [2] (2012)

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