X-ray diffraction analysis to support phase identification in FeSe and\n Fe₇Se₈ epitaxial thin films

2019/01/28 by Sumner B. Harris, Harris, Sumner B., Renato P. Camata +1
Engineering · Materials Science · #Chalcogenide Semiconductor Thin Films #FOS: Physical sciences #Iron-based superconductors research #Materials Science (cond-mat.mtrl-sci) #Microstructure and Mechanical Properties of Steels

paper · pdf · doi:10.48550/arxiv.1901.09794

openalex publication_date 2019/01/28 · openalex created_date 2022/07/30 · openalex updated_date 2026/07/28

Abstract

X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin\nfilms grown by pulsed laser deposition (PLD) are presented. The films contain\n\β-FeSe and Fe₇Se₈ phases in a double epitaxy configuration with\nthe \β-FeSe phase (001) oriented on the (001) MgO growth substrate.\nFe₇Se₈ simultaneously takes on two different epitaxial orientations in\ncertain growth conditions, exhibiting both (101)- and (001)- orientations. Each\nof these orientations are verified with the presented XRD data. Additionally,\nXRD data used to determine the PLD target composition as well as mosaic\nstructure of the \β-FeSe phase are shown.\n

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