Exact analytical solution for electrostatic field produced by biased atomic force microscope tip dwelling above dielectric-conductor bi-layer

2004/08/11 by Sergei F. Lyuksyutov, Ruslan A. Sharipov, Lyuksyutov, Sergei F. +7
Engineering · Physics and Astronomy · #Advancements in Photolithography Techniques #FOS: Physical sciences #Force Microscopy Techniques and Applications #Materials Science (cond-mat.mtrl-sci) #Nanofabrication and Lithography Techniques #Soft Condensed Matter (cond-mat.soft) #cond-mat.mtrl-sci #cond-mat.soft

paper · pdf · doi:10.48550/arxiv.cond-mat/0408247

6 pages 1 figure

openalex publication_date 2004/08/11 · arxiv created 2004/08/12 · arxiv updated 2009/12/01 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/28

Abstract

An exact analytical solution based on the method of images has been obtained for the description of the electrostatic field in the system comrising of atomic force microscope (AFM)tip, dielectric, and conductor. The solution provides a step towards quantitative modelling of AFM-assisted electrostatic nanolithography in polymers.

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