2013/05/13 by Jitendra Pal Singh, Singh, Jitendra Pal, Sanjeev Gautam +21
Materials Science · Physics and Astronomy · #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Magnetic properties of thin films #Materials Science (cond-mat.mtrl-sci) #Soft Condensed Matter (cond-mat.soft) #Strongly Correlated Electrons (cond-mat.str-el) #X-ray Spectroscopy and Fluorescence Analysis #cond-mat.mtrl-sci #cond-mat.soft #cond-mat.str-el
paper · pdf · doi:10.48550/arxiv.1305.2717
arxiv created 2013/05/13 · openalex publication_date 2013/05/13 · arxiv updated 2013/05/14 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
Present work investigates the magnetic and electronic structure of MgO/Fe/MgO/Fe/Co/Au multilayer stack grown on Si(100) substrates by electron beam evaporation method. X-ray diffraction study depicts polycrystalline nature of the multilayers. Results obtained from vibrating sample magnetometry (VSM) and near-edge X-ray absorption fine structure spectra (NEXAFS) at Fe & Co L- and Mg & O K-edges are applied to understand the magnetic and electronic properties of this stack and its interface properties. While the spectral features of Fe L-edge spectrum recorded by surface sensitive total electron yield (TEY) mode shows the formation of FeOx at the Fe/MgO interface, the bulk sensitive total fluorescence yield (TFY), shows Fe in metallic nature. Co L-edge spectrum reveals the presence of metallic nature of cobalt in both TEY and TFY modes. Above results are well correlated with X-ray reflectometry.