Electro optic effect measurements for waveguide inscribed in X-cut LiNbO3 substrate using femtosecond laser direct writing process

2023/03/21 by Amar Ghar, Ghar, Amar, Sanyogita +4
Engineering · #Applied Physics (physics.app-ph) #FOS: Physical sciences #Laser Material Processing Techniques #Optics (physics.optics) #Photonic and Optical Devices #Semiconductor Lasers and Optical Devices

paper · pdf · doi:10.48550/arxiv.2303.11569

openalex publication_date 2023/03/21 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

This work represents a particular application of waveguide fabricated by femtosecond laser micromachining technology. More specifically, we report the development of an optical modulator based on the fabrication of single-mode optical waveguide structures buried in X-cut lithium niobate crystal with the femtosecond laser direct writing method. Here, change in refractive index profile is measured using near field intensity profile measurement method at optimized writing conditions. It has been observed that the change refractive index (Δn) is in the range of 10-4. Finally, the behavior of femtosecond written waveguides as an intensity modulator at 632.8 nm and 1550 nm under the influence of an external electric field is analyzed by pattering electrode structures on the substrate respectively.

Related

• Modeling of the refractive index profile of a femtosecondwritten waveguide in LiNbO3
• Optimisation of microstructured waveguides in z-cut LiNbO3 crystals
• Fabrication of polarization-independent single-mode waveguides in lithium niobate crystal with femtosecond laser pulses
• Low-loss Lithium Niobate on Insulator (LNOI) Waveguides of a 10 cm-length and a Sub-nanometer Surface Roughness
• High-precision measurement of a propagation loss of single-mode optical waveguides on lithium niobate on insulator