2014/07/08 by Jianjia Zhang, Zhang, Jianjia, Lei Wang +5
Computer Science · Engineering · #Computer Vision and Pattern Recognition (cs.CV) #FOS: Computer and information sciences #Face and Expression Recognition #Remote-Sensing Image Classification #Sparse and Compressive Sensing Techniques
paper · pdf · doi:10.48550/arxiv.1407.1974
openalex publication_date 2014/07/08 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
Stein kernel has recently shown promising performance on classifying images represented by symmetric positive definite (SPD) matrices. It evaluates the similarity between two SPD matrices through their eigenvalues. In this paper, we argue that directly using the original eigenvalues may be problematic because: i) Eigenvalue estimation becomes biased when the number of samples is inadequate, which may lead to unreliable kernel evaluation; ii) More importantly, eigenvalues only reflect the property of an individual SPD matrix. They are not necessarily optimal for computing Stein kernel when the goal is to discriminate different sets of SPD matrices. To address the two issues in one shot, we propose a discriminative Stein kernel, in which an extra parameter vector is defined to adjust the eigenvalues of the input SPD matrices. The optimal parameter values are sought by optimizing a proxy of classification performance. To show the generality of the proposed method, three different kernel learning criteria that are commonly used in the literature are employed respectively as a proxy. A comprehensive experimental study is conducted on a variety of image classification tasks to compare our proposed discriminative Stein kernel with the original Stein kernel and other commonly used methods for evaluating the similarity between SPD matrices. The experimental results demonstrate that, the discriminative Stein kernel can attain greater discrimination and better align with classification tasks by altering the eigenvalues. This makes it produce higher classification performance than the original Stein kernel and other commonly used methods.