Micromagnetic approach to exchange bias---A new look at an old problem

2013/06/25 by J. Dubowik, Dubowik, J., Gościańska, I.
Chemistry · Medicine · Physics and Astronomy · #Advanced MRI Techniques and Applications #Advanced NMR Techniques and Applications #FOS: Physical sciences #Magnetic properties of thin films #Materials Science (cond-mat.mtrl-sci)

paper · pdf · doi:10.48550/arxiv.1306.5988

openalex publication_date 2013/06/25 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

We present a micromagnetic approach to exchange bias (EB) in ferromagnetic (FM)/antiferromagnetic (AFM) thin film systems with a small number of irreversible interfacial magnetic moments. We express the exchange bias field H_EB in terms of fundamental micromagnetic length scale---the exchange length l_ex. The benefit from this approach is a better separation of a term related to FM layer from a term related to FM/AFM coupling at interfaces. Using this approach we estimate the highest limit of H_EB in real FM/AFM systems.

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