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RESCUE: Interdependent Challenges of Reliability, Security and Quality\n in Nanoelectronic Systems

2019/11/29 by Maksim Jenihhin, Said Hamdioui, Jenihhin, Maksim +33
Engineering · #Advancements in Semiconductor Devices and Circuit Design #Cryptography and Security (cs.CR) #Distributed #FOS: Computer and information sciences #FOS: Electrical engineering #Parallel #Radiation Effects in Electronics #Semiconductor materials and devices #Signal Processing (eess.SP) #Software Engineering (cs.SE) #and Cluster Computing (cs.DC) #electronic engineering #information engineering

paper · pdf · doi:10.48550/arxiv.1912.01561

openalex publication_date 2019/11/29 · openalex created_date 2022/07/26 · openalex updated_date 2026/07/28

Abstract

The recent trends for nanoelectronic computing systems include\nmachine-to-machine communication in the era of Internet-of-Things (IoT) and\nautonomous systems, complex safety-critical applications, extreme\nminiaturization of implementation technologies and intensive interaction with\nthe physical world. These set tough requirements on mutually dependent\nextra-functional design aspects. The H2020 MSCA ITN project RESCUE is focused\non key challenges for reliability, security and quality, as well as related\nelectronic design automation tools and methodologies. The objectives include\nboth research advancements and cross-sectoral training of a new generation of\ninterdisciplinary researchers. Notable interdisciplinary collaborative research\nresults for the first half-period include novel approaches for test generation,\nsoft-error and transient faults vulnerability analysis, cross-layer\nfault-tolerance and error-resilience, functional safety validation, reliability\nassessment and run-time management, HW security enhancement and initial\nimplementation of these into holistic EDA tools.\n

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