2024/01/08 by J. Hawreliak, Hawreliak, James A., J. M. Winey +5
Materials Science · Engineering · #Diamond and Carbon-based Materials Research #Electronic and Structural Properties of Oxides #Integrated Circuits and Semiconductor Failure Analysis
paper · pdf · doi:10.48550/arxiv.2401.04213
We have carefully examined the above-referenced paper and find the claims of stacking fault formation and transonic dislocation propagation in diamond to be not valid. Additionally, it is quite puzzling that 14 authors on this paper are also co-authors on another recent paper that directly conflicts with the dislocation claims in the Science paper.