2002/09/05 by Ayan Banerjee, Banerjee, Ayan, Dipankar Das +3
Materials Science · Physics and Astronomy · #Atomic Physics (physics.atom-ph) #FOS: Physical sciences #Surface and Thin Film Phenomena #X-ray Diffraction in Crystallography #physics.atom-ph
paper · pdf · doi:10.48550/arxiv.physics/0209019
4 pages, 4 figures
arxiv created 2002/09/05 · openalex publication_date 2002/09/05 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We demonstrate a new technique for measuring the absolute frequencies of atomic transitions. The technique uses a ring-cavity resonator whose length is calibrated using a reference laser locked to the D2 line in 87Rb. The frequency of this line is known to be 384 230 484.468(10) MHz. Using a second laser locked to the D1 line of Rb, we measure the frequencies of various hyperfine transitions in the D1 and D2 lines with a precision of 30 kHz. We obtain the following values: 120.687(17) MHz and 406.520(25) MHz for the 5P1/2 hyperfine constant A in 85Rb and 87Rb; 377 107 385.623(50) MHz and 377 107 463.209(50) MHz for the D1 line in 85Rb and 87Rb; and 384 230 406.528(50) MHz for the D2 line in 85Rb. This yields the fine-structure interval and the isotope shifts. The precision obtained is a significant improvement over previous measurements.