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A SOI-Based Low Noise and Wide Dynamic Range Event-Driven Detector for X-Ray Imaging

2015/07/24 by Sumeet Shrestha, Hiroki Kamehama, Shrestha, Sumeet +14
Engineering · Physics and Astronomy · #CCD and CMOS Imaging Sensors #FOS: Physical sciences #Instrumentation and Detectors (physics.ins-det) #Particle Detector Development and Performance #Radiation Detection and Scintillator Technologies #physics.ins-det

paper · pdf · doi:10.48550/arxiv.1507.06747

6 pages, 8 figures

arxiv created 2015/07/24 · openalex publication_date 2015/07/24 · arxiv updated 2015/07/27 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

A low noise and wide dynamic range event driven detector for the detection of X-Ray energy is realized using 0.2 [um] Silicon on insulator (SOI) technology. Pixel circuits are divided into two parts; signal sensing circuit and event detection circuit. Event detection circuit is activated when X-Ray energy falls into the detector. In-pixel gain selection is implemented for the detection of a small signal and wide band of energy particle. Adaptive gain and capability of correlated double sampling (CDS) technique for the kTC noise canceling of charge detector realizes the low noise and high dynamic range event driven detector.

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