2016/09/22 by Hugh Simons, Henning Friis Poulsen, Simons, H. +5
Physics and Astronomy · Earth and Planetary Sciences · #Advanced X-ray Imaging Techniques #High-pressure geophysics and materials #Crystallography and Radiation Phenomena
paper · pdf · doi:10.48550/arxiv.1609.07513
Following the recent developement of Fourier ptychographic microscopy (FPM) in the visible range by Zheng et al. (2013), we propose an adaptation for hard x-rays. FPM employs ptychographic reconstruction to merge a series of low-resolution, wide field of view images into a high-resolution image. In the x-ray range this opens the possibility to overcome the limited numerical aperture of existing x-ray lenses. Furthermore, digital wave front correction (DWC) may be used to charaterize and correct lens imperfections. Given the diffraction limit achievable with x-ray lenses (below 100 nm), x-ray Fourier ptychographic microscopy (XFPM) should be able to reach resolutions in the 10 nm range.