2016/08/27 by Masaki Kobayashi, Kobayashi, Masaki, Shinobu Ohya +19
Engineering · Materials Science · #Advanced Semiconductor Detectors and Materials #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #Photocathodes and Microchannel Plates
paper · pdf · doi:10.48550/arxiv.1608.07718
openalex publication_date 2016/08/27 · openalex created_date 2016/09/16 · openalex updated_date 2026/07/28
Clarification of the position of the Fermi level (EF) is important in understanding the origin of ferromagnetism in the prototypical ferromagnetic semiconductor Ga1-xMnxAs (GaMnAs). In a recent publication, Souma et al. [Sci. Rep. 6, 27266 (2016)], have investigated the band structure and the EF position of GaMnAs using angle-resolved photoemission spectroscopy (ARPES), and concluded that EF is located in the valence band (VB). However, this conclusion contradicts a number of recent experimental results for GaMnAs, which showed that EF is located above the VB maximum in the impurity band (IB). Here, we show an alternative interpretation of their ARPES experiments, which is consistent with those recent experiments and supports the picture that EF is located above the VB maximum in the IB.