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A Driver ASIC for Scientific CCD Detectors Using 180nm Technology

2018/05/29 by Jie Gao, Gao, Jie, Yi Feng +12
Engineering · #CCD and CMOS Imaging Sensors #FOS: Physical sciences #Image Processing Techniques and Applications #Infrared Target Detection Methodologies #Instrumentation and Detectors (physics.ins-det)

paper · pdf · doi:10.48550/arxiv.1805.12211

openalex publication_date 2018/05/29 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

In order to achieve the driver function for several types of scientific CCD detector from E2V Co Ltd, and decreasing the size of electronics of CCD detector system, an Application-specified Integrated Circuit (ASIC) was designed. It provides multi-channel clocks and bias voltage for CCD driver. In the ASIC, the clock drivers are made of a clock switch circuit and high voltage amplifier. Two 8-bit current-steering DACs are used to adjust the driver capability and high-level voltage of clocks. The bias drivers are generated by 8-bit current-steering DACs and off-chip operation amplifiers. The Global Foundry 180 nm BCDlite technology is selected to implement this design. The first version of design has been finished and the tests have been done.

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