Scaling of gamma-spectra registered by semiconductor detectors

2012/11/20 by E. G. Obrazovskii, Obrazovskii, E. G.
Physics and Astronomy · Engineering · #Radiation Detection and Scintillator Technologies #Advanced Semiconductor Detectors and Materials #Calibration and Measurement Techniques

paper · pdf · doi:10.48550/arxiv.1211.4714

Abstract

Scaling properties of gamma-spectra recorded by semiconductor detectors are investigated. For practical purposes the method of simulation multicomponent spectra using single experimental spectrum are suggested.

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