2000/03/28 by K. V. Klementev, Klementev, K. V.
Materials Science · Physics and Astronomy · #Data Analysis #FOS: Physical sciences #Machine Learning in Materials Science #Nuclear Physics and Applications #Statistics and Probability (physics.data-an) #X-ray Spectroscopy and Fluorescence Analysis #physics.data-an
paper · pdf · doi:10.48550/arxiv.physics/0003087
10 pages, 4 figures, for freeware XAFS analysis program, see http://www.crosswinds.net/~klmn/viper.html
arxiv created 2000/03/28 · openalex publication_date 2000/03/28 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
The problem of error analysis is addressed in stages beginning with the case of uncorrelated parameters and proceeding to the Bayesian problem that takes into account all possible correlations when a great deal of prior information about the accessible parametr space is available. The formulas for the standard deviations and deviations with arbitrary confidence levels are derived. Underestimation of the errors of XAFS-function extraction is shown to be a source of unjustified optimistic errors of fitting parameters. The applications of statistical chi2- and F-tests to the fitting problems are also discussed.