2015/06/26 by Sergei V. Zhukovsky, Andrei Andryieuski, Zhukovsky, Sergei V. +11
Engineering · Materials Science · Physics and Astronomy · #FOS: Physical sciences #Optical Coatings and Gratings #Optics (physics.optics) #Photonic Crystals and Applications #Photonic and Optical Devices
paper · pdf · doi:10.48550/arxiv.1506.08078
openalex publication_date 2015/06/26 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We experimentally demonstrate the effect of anomalous breakdown of the\neffective medium approximation in all-dielectric deeply subwavelength thickness\n(d \∼\λ/160-\λ/30) multilayers, as recently predicted\ntheoretically [H.H. Sheinfux et al., Phys. Rev. Lett. 113, 243901 (2014)].\nMultilayer stacks are composed of alternating alumina and titania layers\nfabricated using atomic layer deposition. For light incident on such\nmultilayers at angles near the total internal reflection we observe pronounced\ndifferences in the reflectance spectra for structures with 10-nm versus 20-nm\nthick layers, as well as for structures with different layers ordering,\ncontrary to the predictions of the effective medium approximation. The\nreflectance difference can reach values up to 0.5, owing to the chosen\ngeometrical configuration with an additional resonator layer employed for the\nenhancement of the effect. Our results are important for the development of new\nhigh-precision multilayer ellipsometry methods and schemes, as well as in a\nbroad range of sensing applications.\n