Method for Identifying Crystalline Phases in X-ray Diffraction Data from Multiphase Samples

2021/08/06 by Skorbun, A. D., Gabielkov, S. V., Zhyganiuk, I. V.
#FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci)

paper · doi:10.48550/arxiv.2108.07176

Abstract

A new method for identifying crystalline phases in X-ray diffraction data has been proposed, which is especially useful for the study of multiphase materials (more than eight - ten phases) with a relatively low content (less than 1 - 3 wt%). The method is based on a statistical analysis of data and provides an unambiguous non-quantitative criterion for the presence of one or another phase in the material. It has been shown that the method works reliably in cases where a significant number of reflexes (more than several dozen) on the diffraction pattern are comparable with intensity-to-noise ratio.

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