Noninvasive measurement of micron electron beam size of high energy using diffraction radiation

2003/05/05 by G. Naumenko, Naumenko, G.
Physics and Astronomy · #FOS: Physical sciences #High Energy Physics - Experiment (hep-ex) #hep-ex

paper · pdf · doi:10.48550/arxiv.hep-ex/0305004

6 pages, 6 figures

arxiv created 2004/05/31 · arxiv updated 2009/11/30

Abstract

Treatments of the usage of optical diffraction radiation from the relativistic electrons moving though a conductive slit for the noninvasive transverse beam size measurement encounter hard limitation of the method sensitivity for the electron energy larger than 1 GeV. We consider in this article a possibility of application in a diffraction radiation technique the artificial phase shift, which can take place when transverse electron position varies. This allows us to realize the nonivasive measurements of transverse size of supper-relativistic electron beams with the small emittance.

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