2011/12/21 by Y. Fukuda, Yuji Fukuda, Fukuda, Y. +44
Earth and Planetary Sciences · Engineering · Physics and Astronomy · #Accelerator Physics (physics.acc-ph) #Atomic and Molecular Clusters (physics.atm-clus) #FOS: Physical sciences #High-pressure geophysics and materials #Instrumentation and Detectors (physics.ins-det) #Laser-Plasma Interactions and Diagnostics #Laser-induced spectroscopy and plasma #Plasma Physics (physics.plasm-ph) #physics.acc-ph #physics.atm-clus #physics.ins-det #physics.plasm-ph
paper · pdf · doi:10.48550/arxiv.1112.4948
arxiv created 2011/12/21 · openalex publication_date 2011/12/21 · arxiv updated 2011/12/22 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
A new diagnosis method for high energy ions utilizing a single CR-39 detector mounted on plastic plates is demonstrated to identify the presence of the high energy component beyond the CR-39's detection threshold limit. On irradiation of the CR-39 detector unit with a 25 MeV per nucleon He ion beam from conventional rf-accelerators, a large number of etch pits having elliptical opening shapes are observed on the rear surface of the CR-39. Detailed investigations reveal that these etch pits are created by heavy ions inelastically backscattered from the plastic plates. This ion detection method is applied to laser-driven ion acceleration experiments using cluster-gas targets, and ion signals with energies up to 50 MeV per nucleon are identified.