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Designing fault-tolerant circuits using detector error models

2024/07/18 by Peter-Jan H. S. Derks, Alex Townsend-Teague, Derks, Peter-Jan H. S. +5 · 14 citations
Computer Science · Engineering · #Advancements in Semiconductor Devices and Circuit Design #FOS: Physical sciences #Quantum Physics (quant-ph) #Radiation Effects in Electronics #VLSI and Analog Circuit Testing

paper · pdf · doi:10.48550/arxiv.2407.13826

openalex publication_date 2024/07/18 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

Quantum error-correcting codes, such as subspace, subsystem, and Floquet codes, are typically constructed within the stabilizer formalism, which does not fully capture the idea of fault-tolerance needed for practical quantum computing applications. In this work, we explore the remarkably powerful formalism of detector error models, which fully captures fault-tolerance at the circuit level. We introduce the detector error model formalism in a pedagogical manner and provide several examples. Additionally, we apply the formalism to three different levels of abstraction in the engineering cycle of fault-tolerant circuit designs: finding robust syndrome extraction circuits, identifying efficient measurement schedules, and constructing fault-tolerant procedures. We enhance the surface code's resistance to measurement errors, devise short measurement schedules for color codes, and implement a more efficient fault-tolerant method for measuring logical operators.

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