2013/08/27 by Matias Nordin, Christoffer Abrahamsson, Nordin, Matias +11
Biochemistry, Genetics and Molecular Biology · Engineering · Environmental Science · Materials Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Advanced X-ray Imaging Techniques #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #Soil Geostatistics and Mapping #Surface Roughness and Optical Measurements #cond-mat.mtrl-sci
paper · pdf · doi:10.48550/arxiv.1308.5958
arxiv created 2013/08/27 · openalex publication_date 2013/08/27 · arxiv updated 2013/08/28 · openalex created_date 2022/10/03 · openalex updated_date 2026/07/28
In this study we investigate the functional behavior of the intensity in high-angle annular dark field (HAADF) scanning transmission electron micrograph (STEM) images. The model material is a silica particle (20 nm) gel at 5 wt%. By assuming that the intensity response is monotonically increasing with increasing mass thickness of silica, an estimate of the functional form is calculated using a maximum likelihood approach. We conclude that a linear functional form of the intensity provides a fair estimate but that a power function is significantly better for estimating the amount of silica in the z-direction. The work adds to the development of quantifying material properties from electron micrographs, especially in the field of tomography methods and three-dimensional quantitative structural characterization from a STEM micrograph. It also provides means for direct three-dimensional quantitative structural characterization from a STEM micrograph.