2021/11/09 by Sebastian Dingler, Dingler, Sebastian
Computer Science · Decision Sciences · Engineering · #Advanced Measurement and Metrology Techniques #FOS: Electrical engineering #Image and Object Detection Techniques #Scientific Measurement and Uncertainty Evaluation #Systems and Control (eess.SY) #electronic engineering #information engineering
paper · pdf · doi:10.48550/arxiv.2111.05359
openalex publication_date 2021/11/09 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
This work deals with fitting of ellipses to noisy measurements. The literature knows many different approaches for this. The main representatives are presented and discussed in this paper. Furthermore, the case is considered when outliers are present in the measurement data. Robust methods which are less sensitive to outliers are suitable for this case. All discussed methods are compared by a simulation. The code for the simulation is available for free use on github.com/sebdi/ellipse-fitting.