2019/03/06 by Sotiris Psilodimitrakopoulos, Psilodimitrakopoulos, Sotiris, Leonidas Mouchliadis +11
Biochemistry, Genetics and Molecular Biology · Engineering · Physics and Astronomy · #Advanced Fluorescence Microscopy Techniques #FOS: Physical sciences #Mesoscale and Nanoscale Physics (cond-mat.mes-hall) #Photoacoustic and Ultrasonic Imaging #Spectroscopy and Quantum Chemical Studies
paper · pdf · doi:10.48550/arxiv.1903.02431
openalex publication_date 2019/03/06 · openalex created_date 2022/07/13 · openalex updated_date 2026/07/28
Stacked atomically thin transition metal dichalcogenides (TMDs) exhibit\nfundamentally new physical properties compared to those of the individual\nlayers. The twist angle between the layers plays a crucial role in tuning these\nproperties. Having a tool that provides highresolution, large area mapping of\nthe twist angle, would be of great importance in the characterization of such\n2D structures. Here we use polarization-resolved second harmonic generation\n(P-SHG) imaging microscopy to rapidly map the twist angle in large areas of\noverlapping WS2 stacked layers. The robustness of our methodology lies in the\ncombination of both intensity and polarization measurements of SHG in the\noverlapping region. This allows the accurate measurement and consequent\npixel-by-pixel mapping of the twist angle in this area. For the specific case\nof 30o twist angle, P-SHG enables imaging of individual layers.\n