2023/06/20 by David Noel, Noel, David
Computer Science · Engineering · Physics and Astronomy · #Applied Physics (physics.app-ph) #FOS: Physical sciences #Force Microscopy Techniques and Applications #Integrated Circuits and Semiconductor Failure Analysis #VLSI and Analog Circuit Testing
paper · pdf · doi:10.48550/arxiv.2306.11209
openalex publication_date 2023/06/20 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
Magnetic Field Imaging (MFI) is the newest Fault Isolation/Failure analysis technique to non-destructively and non-invasively localize defects such as electrical shorts and opens in both the die and package levels of Flip-Chips. This is accomplished using Magnetic Current Imaging (MCI) and Space-Domain Reflectometry (SDR) techniques accompanied using a Giant Magneto-Resistor (GMR), which provides detailed spatial optical images at sub-micron resolutions to localize further and identify defects [1]. This paper will demonstrate the use of MCI to locate electrical shorts by imaging the magnetic fields induced by the current-carrying wire bonds using a Superconducting Quantum Interference Device (SQUID) [2], then implement SDR to locate electrical opens using SQUID and GMR to produce detailed optical images of the defect locations. The exact location of the defect can then be localized by using a CAD overlay of the circuit schematic with the optical and MCI images.