Electron Emission Yield Datasets Under Electron Impact From Surfaces Characterized In Situ by XPS or AES

2025/12/09 by Belhaj, M., dadouch, S.
Biochemistry, Genetics and Molecular Biology · Materials Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Applied Physics (physics.app-ph) #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #X-ray Spectroscopy and Fluorescence Analysis

paper · doi:10.48550/arxiv.2512.08693

openalex publication_date 2025/12/09 · openalex created_date 2025/12/11 · openalex updated_date 2026/07/28

Abstract

We present the measurement, characterization, and calibration procedures used to produce a series of datasets for various conductive and semiconductive materials. The data, provided, include emission yields as a function of incident electron energy together with surface composition obtained from X-Ray Photoelectron Spectroscopy or Auger Electron Spectroscopy analyses. Initial datasets cover copper and gold, with additional materials to be released on arXiv.

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