Mathematical analysis of the operation of a scanning Kelvin probe

2019/07/17 by Edgar A. Pina-Galan, Pina-Galan, Edgar A.
Engineering · Physics and Astronomy · #00-XX 00Axx 00A79 #Classical Physics (physics.class-ph) #FOS: Physical sciences #Force Microscopy Techniques and Applications #Instrumentation and Detectors (physics.ins-det) #Near-Field Optical Microscopy #Surface and Thin Film Phenomena

paper · pdf · doi:10.48550/arxiv.1907.07465

openalex publication_date 2019/07/17 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

The scanning Kelvin probe is a tool that allows for the contactless evaluation of contact potential differences in a range of materials, permitting the indirect determination of surface properties such as work function or Fermi levels. In this paper, we derive the equations governing the operation of a Kelvin probe and describe the implementation of the off-null method for contact potential difference determination, we conclude with a short discussion on design considerations.

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