2020/11/25 by Peter Moeck, Moeck, Peter
Biochemistry, Genetics and Molecular Biology · Materials Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Electron and X-Ray Spectroscopy Techniques #FOS: Electrical engineering #FOS: Physical sciences #Force Microscopy Techniques and Applications #Image and Video Processing (eess.IV) #Materials Science (cond-mat.mtrl-sci) #electronic engineering #information engineering
paper · pdf · doi:10.48550/arxiv.2011.13102
openalex publication_date 2020/11/25 · openalex created_date 2022/07/25 · openalex updated_date 2026/07/28
This book chapter reviews progress in crystallographic image processing (CIP)\nfor scanning probe microscopy (SPM) that has occurred since our description of\nthe technique was first put into open access in this book series in the year\n2010. The signal to noise ratio in all kinds of experimental images of more or\nless regular 2D periodic arrays is significantly enhanced by CIP and the\ntechnique is independent of the type of recording device. In the SPM imaging\ncontext, CIP can be understood as an a posteriori sharpening of the effective\nexperimental scanning probe tip by computational means. It is now possible to\nremove multiple scanning probe mini-tip effects in images from 2D periodic\narrays of physical objects that either self-assembled or were created\nartificially. Accepted within the scientific community is by now also the fact\nthat SPM tips can change their shape and fine structure during the operation of\na microscope and, thereby, obfuscate the recorded images in systematic ways.\nCIP restores much of the smeared out information in such images. The adaptation\nof a geometric Akaike Information Criterion from the robotics and computer\nvision community to the unambiguous detection of 2D translation symmetries\nenabled much of our recent progress. In the main body of this book chapter, we\ndiscuss this adaptation and briefly illustrate its utility on an example.\n