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J-PAS: First Identification, Physical Properties and Ionization Efficiency of Extreme Emission Line Galaxies

2025/12/09 by Giménez-Alcázar, A., Amorín, R., Vílchez, J. M. +32
#Astrophysics of Galaxies (astro-ph.GA) #FOS: Physical sciences

paper · doi:10.48550/arxiv.2512.08484

Abstract

Extreme emission line galaxies (EELGs) are key tracers of intense star formation and potential analogues of the sources that reionized the early Universe. Their low-redshift counterparts offer a unique opportunity to study the physical conditions that enable high ionizing-photon escape fractions. We present a robust method to photometrically identify EELGs in the J-PAS survey, which provides 56 optical bands over 8500 deg2. Using data from a fully observed 30 deg2 region, we combine narrow-band equivalent widths with machine-learning techniques to select galaxies with emission lines above 300 Å. The method achieves 95% purity and 96% completeness for iSDSS<22.5 mag. We identify 917 EELGs up to z=0.8; spectroscopic cross-matching with DESI/DR1 confirms the reliability of our redshifts and emission-line measurements. The selected galaxies show strong correlations between ξion and EW([OIII]), consistent with previous low- and high-z studies. Most sources exceed the ionizing efficiency threshold required for reionization, reinforcing their role as local analogues of early-Universe galaxies.

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