2013/04/18 by Pengfei Zhu, H. Berger, Zhu, Pengfei +21 · 1 citation
Biochemistry, Genetics and Molecular Biology · Engineering · Physics and Astronomy · #Accelerator Physics (physics.acc-ph) #Advanced Electron Microscopy Techniques and Applications #Advanced X-ray Imaging Techniques #FOS: Physical sciences #Instrumentation and Detectors (physics.ins-det) #Integrated Circuits and Semiconductor Failure Analysis #Strongly Correlated Electrons (cond-mat.str-el)
paper · pdf · doi:10.48550/arxiv.1304.5176
openalex publication_date 2013/04/18 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We report the experimental demonstration of femtosecond electron diffraction using high-brightness MeV electron beams. High-quality, single-shot electron diffraction patterns for both polycrystalline aluminum and single-crystal 1T-TaS2 are obtained utilizing a 5 femto-Coulomb (~3x104 electrons) pulse of electrons at 2.8 MeV. The high quality of the electron diffraction patterns confirm that electron beam has a normalized emittance of ~50 nm-rad. The corresponding transverse and longitudinal coherence length are ~11 nm and ~2.5 nm, respectively. The timing jitter between the pump laser and probe electron beam was found to be ~ 100 fs (rms). The temporal resolution is demonstrated by observing the evolution of Bragg and superlattice peaks of 1T-TaS2 following an 800 nm optical pump and was found to be 130 fs. Our results demonstrate the advantages of MeV electron diffraction: such as longer coherent lengths, large scattering cross-section and larger signal-to-noise ratio, and the feasibility of ultimately realizing 10 fs time-resolved electron diffraction.