2007/12/19 by X. T. Pham Phu, Phu, X. T. Pham, V. Thanh Ngo +3
Economics, Econometrics and Finance · Physics and Astronomy · #Complex Systems and Time Series Analysis #FOS: Physical sciences #Magnetic properties of thin films #Materials Science (cond-mat.mtrl-sci) #Theoretical and Computational Physics #cond-mat.mtrl-sci
paper · pdf · doi:10.48550/arxiv.0712.3181
10 pages, 19 figures
arxiv created 2007/12/19 · openalex publication_date 2007/12/19 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We study the critical behavior of magnetic thin films as a function of the film thickness. We use the ferromagnetic Ising model with the high-resolution multiple histogram Monte Carlo (MC) simulation. We show that though the 2D behavior remains dominant at small thicknesses, there is a systematic continuous deviation of the critical exponents from their 2D values. We observe that in the same range of varying thickness the deviation of the exponent ν is rather small, while exponent β suffers a larger deviation. We explain these deviations using the concept of "effective" exponents suggested by Capehart and Fisher in a finite-size analysis. The shift of the critical temperature with the film thickness obtained here by MC simulation is in an excellent agreement with their prediction.