2009/09/19 by Shuogang Huang, H. M. Christen, Huang, Shuogang +4
Engineering · Physics and Astronomy · #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #Near-Field Optical Microscopy #Photonic Crystals and Applications #Photonic and Optical Devices #cond-mat.mtrl-sci
paper · pdf · doi:10.48550/arxiv.0909.3579
18 pages, 10 figs
arxiv created 2009/09/19 · openalex publication_date 2009/09/19 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We present a method for extracting high-spatial resolution dielectric constant data at microwave frequencies. A scanning near field microwave microscope probes a sample and acquires data in the form of the frequency and quality factor shifts of a resonant cavity coupled to the sample. The approach reported here is to calculate the electromagnetic fields by the finite element method in both static and time-dependent modes. Cavity perturbation theory connects the measured frequency shifts to changes in the computed energy stored in the electromagnetic field. In this way, the complex permittivity of the sample is found. Of particular interest are thin-film materials, for which a method is reported here to determine the dielectric constant without the need to use any fitting parameters.